Publications

Xiaoqing Pan

  1. J. C. Jiang, X. Q. Pan, G. W. Graham, R. W. McCabe, and J. Schwank, "Microstructure of a Pd/Ceria-Zirconia Catalyst After High-Temperature Aging," Catalysis Letters, in press.
  2. X. Pan, J. C. Jiang, W. Tian, Q. Gan, and C. B. Eom, "Effects of Stress Relaxation of Epitaxial SrRuO3 Thin Films on Microstructures," submitted to Appl. Phys. Lett.
  3. J. C. Jiang, W. Tian, X. Pan, Q. Gan, and C. B. Eom, "Domain Structure of Epitaxial SrRuO3 Thin Films on Miscut (001) SrTiO3 Substrates," Appl. Phys. Lett., 72[23], 2963-65(1998).
  4. C. D. Theis, J. Yeh, and D. G. Schlom, M. E. Hawley, G. W. Brown, J. C. Jiang, and X. Pan, "Adsorption-Controlled Growth of Bi4Ti3O12 by Reactive Molecular Beam Epitaxy," Appl. Phys. Lett., 72[22], 2817-19(1998).
  5. J. C. Jiang, X. Pan, and C. L. Chen, "Domain Structures of Epitaxial SrRuO3 Thin Films," in Ferroelectric Thin Films VI, Ed. R. Treece, R. Jones, S. B. Desu, C. M. Foster, and I. Yoo, (Mater. Res. Soc. Proc. 493, Pittsburgh, PA, 1998), pp. 195-200.
  6. J. C. Jiang, W. Tian, X. Pan, Q. Gan, and C. B. Eom, "Effects of Miscut of the SrTiO3 Substrate on Microstructures of the Epitaxial SrRuO3 Thin Films," Mater. Sci. Eng. B, in press.
  7. J.C. Jiang, X. Pan, and C.L. Chen, "Microstructure of Epitaxial SrRuO3 Thin Films on (001) SrTiO3," Appl. Phys. Lett., 72[8], 909-911 (1998).
  8. R. Brydson, S.-C. Chen, F. L. Riley, S. J. Milne, X. Pan, and M. Rühle, "Microstructure and Chemistry of Intergranular Glassy Films in Liquid Phase Sintered Alumina," J. Am. Cream. Soc., 81[2], 369-79 (1998).
  9. X. Pan and J. G. Zheng, "Microstructure of and Crystal Defects in Nanocrystalline Tin Dioxide Thin Films," in Polycrystalline Thin Films - Structure, Texture, Properties and Applications III, Eds. S. M. Yalisove, B. L. Adams, J. S. Im, Y. Zhu, and F. R. Chen, (Mater. Res. Soc. Proc. 472, Pittsburgh, PA, 1996), pp.87-92.
  10. E.Y. Wang, X. Pan, J.F. Mansfield, T. Kennedy, and S. Hampshire, "TEM Stuties of Silicon Nitride-Silicon Carbide Nanocomposites", Microscopy and Microanalysis 1997, Eds. G.W. Bailey, R.V.W. Dimlich, K.B. Alexander, J.J. McCarthy, and T. P. Pretlow, Vol. 3, pp. 411-12 (1997).
  11. L. Fu, X. Pan, and M.J. Hoffmann, "Grain Boundary Microstructure of a Hot Isostatically Pressed Silicon Nitride", Microscopy and Microanalysis 1997, Eds. G.W. Bailey, R.V.W. Dimlich, K.B. Alexander, J.J. McCarthy, and T. P. Pretlow, Vol. 3, pp. 411-12 (1997).
  12. Q. D. Jiang, X. Pan, and J. Zegenhagen, "Atomic Scale Structure of a SrTiO3 Bicrystal Boundary Studied by Scanning Tunneling Microscopy," Phys. Rev. B56 [11], 6947-6951 (1997).
  13. C.-M. Wang, X. Pan, H. Gu, G. Duscher, M. J. Hoffmann, R. M. Cannon, and M. Rühle, "Transient Growth Bands in Silicon Nitride Cooled in Rare Earth-Based Glass", J. Am. Ceram. Soc., 80[6], 1397-404 (1997).
  14. X. Pan, W. D. Kaplan, M. Rühle, and R. E. Newnham, "A Quantitative Comparison of TEM Techniques for the Study of Localized Ordering on a Nano-Scale," J. Am. Ceram. Soc., in press.
  15. X. Pan, "Atomistic Structure of Silicon Nitride/Silicate Glass Interfaces," J. Am. Ceram. Soc., 79[11], 2975-79 (1996).
  16. H. Sieber, D. Hesse, X. Pan, St. Senz, and J. Heydenreich, "TEM Investigations of Spinel-Forming Solid State Reactions: Reaction Mechanism, Film Orientation and Interface Structure during MgAl2O4 Formation on MgO (001) and Al2O3 (1.2) Single Crystal Substrates", Z. anorg. allg. Chem. 622, 1658-1666 (1996).
  17. C.-M. Wang, X. Pan, M. J. Hoffmann, R. M. Cannon, and M. Rühle, "Grain Boundary Films in Rare Earth Glass-Based Silicon Nitride," J. Am. Ceram. Soc., 79 [3], 788-92 (1996).
  18. C.-M. Wang, X. Pan, M. Rühle, F. L. Riley, and M. Mitomo, "Silicon Nitride Crystal Structure and Observations of Lattice Defects," J. Mater. Sci., 31 [20], 5281-5298 (1996).
  19. J.-G. Zheng, X. Pan, M. Schweizer, U. Weimar, W. Göpel and M. Rühle, "Dislocations in Nanocrystalline SnO2 Thin Films," Phil. Mag. Lett., 73[3] 93-100 (1996).
  20. J.-G. Zheng, X. Pan, M. Schweizer, F. Zhou, U. Weimar, W. Göpel and M. Rühle, "Growth Twins in Nanocrystalline SnO2 Thin Films Studied by High Resolution Transmission Electron Microscopy," J. Appl. Phys., 79[10], 7688-7694 (1996).
  21. C.-M. Wang, X. Pan, and M. Rühle, "Origin of Dislocation Loops in a-Silicon Nitride," J. Mater. Res., 11[7], 1725-32 (1996).
  22. X. Pan, H. Gu, R. van Weeren, S. C. Danforth, R. M. Cannon, and M. Rühle, "Grain-Boundary Microstructure and Chemistry of a Hot Isostatically Pressed High-purity Silicon Nitride," J. Am. Ceram. Soc., 79 [9], 2313-30 (1996).
  23. X. Pan, J. Mayer, M. Rühle, and K. Niihara, "Silicon Nitride Based Ceramic Nanocomposites," J. Am. Ceram. Soc., 79 [3], 585-90 (1996).
  24. X. Pan, H. Sieber, St. Senz, D. Hesse, and J. Heydenreich, "Atomic Resolution Electron Microscopy Studies of Reaction Fronts in Spinel-Forming Solid State Reactions," Intergranular and Interphase Boundaries in Materials, Materials Science Forum, Vol. 207-209, p757-60 (1996), Eds.: E. A. Fortes, Trans Tech Publications, Aedermannsdorf, Switzerland.
  25. X. Pan, M. Rühle, K. Niihara, "Microstructure of Grain and Phase Boundaries in Si3N4-SiC Nanocomposites," Intergranular and Interphase Boundaries in Materials, Materials Science Forum, Vol. 207-209, p761-64 (1996), Eds.: E. A. Fortes, Trans Tech Publications, Aedermannsdorf, Switzerland.
  26. X. Pan, H. Gu, S. Stemmer, and M. Rühle, "Grain Boundary Structure and Composition in Strontium Titanate," Intergranular and Interphase Boundaries in Materials, Materials Science Forum, Vol. 207-209, p421-24 (1996), Eds.: E. A. Fortes, Trans Tech Publications, Aedermannsdorf, Switzerland.
  27. H. Gu, X. Pan, H. Müllejans, M. Rühle, and I. Tanaka, R. M. Cannon, M. J. Hoffmann "Structure and Chemistry of intergranular films in Ca-doped Si3N4 by spatially-resolved electron energy-loss spectroscopy," Intergranular and Interphase Boundaries in Materials, Materials Science Forum, Vol. 207-209, p729-732 (1996), Eds.: E. A. Fortes, Trans Tech Publications, Aedermannsdorf, Switzerland.
  28. J.-G. Zheng, X. Pan, M. Schweizer, U. Weimar, W. Göpel and M. Rühle, "Crystallographic Shear Planes in Nanocrystalline SnO2 Thin Films Studied by High Resolution Transmission Electron Microscopy," J. Mater. Sci., 31[9], 2317-24 (1996).
  29. H.-S. Wang, W. Dietsche, and X. Pan, "Preparation and transport properties of infinite layer film grown by molecular-beam epitaxy," Z. Phys. B96, 305-311 (1995).
  30. H.-S. Wang, W. Dietsche, L. Viczian, and X. Pan, "Structural and Transport Properties of Infinite Layer Ba1-xSrxCuO2+d Films Grown by MBE," Physica C235-240 977-978 (1994).
  31. X. Pan, W. Sigle, F. Phillipp, and A. Seeger, "A New Phase in the Intermetallic Au-Cu System," Phil. Mag. Lett. 70, 203-209 (1994).
  32. X. Pan, W. Sigle, F. Phillipp, A. Seeger, M.G.M. Verwerft, and J.Th.M.De Hosson, "In-situ TEM Study of a new phase of the Au-Cu system," Electron Microscopy 1994, Vol. 2a, p475, Proc. 13th Int. Cong. on Electron Microscopy, Paris, 1994.
  33. X. Pan and H.-G. Unruh, "A Study of the Relaxation of Discommemsurations in K2ZnCl4: III. Measurements of the Complex Dielectric Constant," J. Phys.: Condens. Matter 4, 6909-6918 (1992).
  34. X. Pan and H.-G. Unruh, "A Study of the Relaxation of Discommemsurations in K2ZnCl4: II. Dielectric Measurements at low frequency," J. Phys.: Condens. Matter 4, 6899-6908 (1992).
  35. X. Pan, H.-G. Unruh, and D. Feng, "TEM Study of the 1q to 2q Transition within the Incommensurate Phase of Barium Sodium Niobate," Ferroelectrics 105, 225-230 (1990).
  36. H. Sakata, K. Hamano, X. Pan, and H.-G. Unruh, "Nucleation and Annihilation of Discommensurations in the First-Order Commensurate- Incommensurate Phase Transition in K2ZnCl4," J. Phys. Soc. Japn. 59, 1079-1092 (1990).
  37. X. Pan, H. Gleiter, and D. Feng, "Dynamic Evolution of Discommensurations During the Commensurate-Incommensurate Transition in Barium Sodium Niobate," J. Phys.: Condens. Matter 2, 2603-2623 (1990).
  38. X. Pan and H.-G. Unruh, "Electron Microscopy Study of Discommensurations in K2ZnCl4," J. Phys.: Condens. Matter 2, 323-329 (1990).
  39. X. Pan, "A TEM Study of Discommensurations in K2ZnCl4," Electron Microscopy 1990, Vol. 4, p.714, Proc. XIIth Int. Cong. for Electron Microscopy, Seattle (USA), 1990.
  40. D. Feng, J. Chen, and X. Pan, M. Hu, Y. Tao, and A. Pu, "The Roles of Defects During Phase Transitions in Complex Oxide Crystals," Solid State Phenomena, Vol. 5, p.129-142 (1989).
  41. Y. H. Liang, J. Chen, L. C. Wang, X. Pan, M. Wei, G. Q. Wang. X. Jing, S. Y. Ding, D. Feng, and Q. R. Zhang, "A HREM Study on the Defects in Y-Ba-Cu-O Superconductors," Phys. Stat. Sol. (a)107, 63 (1988).
  42. X. Pan and D. Feng, "Direct Observation of Nucleation of Discommensurations in Barium Sodium Niobate," Phys. Stat. Sol. (a)106, K117 (1988).
  43. D. Feng and X. Pan, "A TEM Study of the Chaotic State in BSN," Electron Microscopy 1986, Vol. 2, p.1239, Proc. XIth Int. Cong. on Electron Microscopy, Kyoto (1986).
  44. D. Feng and X. Pan, "A TEM Study of the Chaotic State in SBN," Electron Microscopy 1986, Vol. 2, p1237. Proc. XIth Int. Cong. on Electron Microscopy, Kyoto (1986).
  45. X. Pan and D. Feng, "A TEM Study of the Incommensurate Phase in BSN and SBN," in Recent Development of Electron Microscopy (Science Press, China) pp.127-130 (1986). Proc. of the third Chinese-Japanese Electron Microscopy Seminar (Hangzhou, 1986).
  46. X. Pan, M. S. Hu, M. H. Yao, and D. Feng, "A TEM Study of the Incommensurate Phase and Related Phase Transitions in Barium Sodium Niobate," Phys. Stat. Sol. (a)91, 57 (1985).