Fig. 1. RHEED patterns with the electron beam incident along the [110] azimuth of the (001)SrTiO₃ substrate for (a) the bare etched (001)SrTiO₃ substrate at ~ 640 °C during exposure to 2 ? 10^­5 Torr of ozone, (b)­(d) during deposition of the Bi₂Ti₃O₁₀ perovskite sheets showing the  a_p to a_p to  a_p transition in the surface periodicity (with concomitant disappearance of half-order streaks), and (e)­(f) during the deposition of the Bi₂O₂ planes where the faded half-order streaks (e) could result from bismuth adatoms reordering on the surface. First citation in article 

Fig. 2. Four-circle x-ray diffraction scans of a 1000 Å thick (001)-oriented Bi₄Ti₃O₁₂ film grown on (001)SrTiO₃. (a) -2 scan indicating that the c axis of the film is 32.6 ± 0.1 Å. The substrate peaks are marked by an asterisk (*). (b) Azimuthal scan (-scan) of the 117 reflections indicating that the in-plane lattice constants of the Bi₄Ti₃O₁₂ film are ab5.50 ± 0.04Å. First citation in article 

Fig. 3. An AFM image of the surface of a 1000 Å thick Bi₄Ti₃O₁₂ film grown on (001) SrTiO₃. First citation in article 

Fig. 4. HRTEM micrographs of a Bi₄Ti₃O₁₂ thin film with the electron beam parallel to the [100] direction. (b) is an enlarged image from the middle of (a). The Bi₂O₂ double layers are indicated by the white double arrows, while the three perovskite sheets are indicated by the black arrows. First citation in article