Thermal transport in a semiconductor heterostructure measured by time-resolved x-ray diffraction

Rachel S. Goldman

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rsgold@umich.edu

2094 H.H. Dow Building

T: (734) 647-6821

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YM Sheu, SH Lee, JK Wahlstrand, DA Walko, EC Landahl, DA Arms, M Reason, RS Goldman, and DA Reis (2008)

PHYSICAL REVIEW B, 78(4):045317.

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