Stress evolution in GaAsN alloy films

Rachel S. Goldman

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rsgold@umich.edu

2094 H.H. Dow Building

T: (734) 647-6821

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M Reason, X Weng, W Ye, D Dettling, S Hanson, G Obeidi, and RS Goldman (2005)

JOURNAL OF APPLIED PHYSICS, 97(10):103523.

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