Dr. Xiaojun Weng

Rachel S. Goldman



2094 H.H. Dow Building

T: (734) 647-6821




Research Facilities


Bachelor of science, materials science; Jiao Tong University
Master of science, materials science; Jiao Tong University
PhD, MSE, University of Michigan

Xiaojun received both his BS and MS in Materials Science from Shanghai Jiao Tong University, became a PhD candidate at U-M in July 2000, and defended his PhD thesis, entitled, "Structural, Electronic, and Optical Properties of Narrow Gap Compound Semiconductors" in December 2002. As a research fellow at UM, he worked jointly with the Goldman and Kieffer groups on an NSF project entitled, "Role of Elastic Anisotropy in Semiconductor Nanopatterning". He joined the Pennsylvania State University, University Park in Feb. 2005, first as a Postdoc Researcher and then a Research Associate with the Materials Research Institute. He is currently a TEM Engineer at Intel Corporation in Hillsboro, Oregon.