Prediction of ceramic stereolithography resin sensitivity from theory and measurement of diffusive photon transport

John William Halloran

Professor Emeritus

peterjon@umich.edu

2010 HH Dow

T: (734) 763-1051

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KC Wu, KF Seefeldt, MJ Solomon, and et al (2005)

JOURNAL OF APPLIED PHYSICS, 98((2)).

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